ISSN 1004-4140
    CN 11-3017/P
    Volume 10 Issue 2
    Jun.  2001
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    Article Contents
    Wang Guan, Jiang Huaizhou, Lian Wei. Repairing High Voltage Malfunction of Shimadzu SCT-3000TE[J]. CT Theory and Applications, 2001, 10(2): 19-20.
    Citation: Wang Guan, Jiang Huaizhou, Lian Wei. Repairing High Voltage Malfunction of Shimadzu SCT-3000TE[J]. CT Theory and Applications, 2001, 10(2): 19-20.

    Repairing High Voltage Malfunction of Shimadzu SCT-3000TE

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    • Received Date: September 17, 2000
    • Available Online: December 28, 2022
    • The paper introduce a method that repairig high voltage malfunction of SHIMADZU SCT-3000TE. That indicate KV ripple affect obviously mA value, the more X-ray photon number, the stronger of accepted signal, but the more KV ripple, the more low energy photon, the less high energy photon, the less photon that arrived at the detector. When malfunction has happened, although the KV average value is normal, but the range of KV ripple change 60%, out of tolerance (less than 10%), so the photon that detected is too low, debase the image quality.

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      Lian Wei

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