ISSN 1004-4140
CN 11-3017/P
HUO Mei-chun, DONG Guo-ping, LIANG Ze, LI Hao, LIU Dan, GU Dong-bo, MIAO Xiang-yue. Development and Application Analysis of a Tester for X-ray Detectors[J]. CT Theory and Applications, 2012, 21(4): 699-704.
Citation: HUO Mei-chun, DONG Guo-ping, LIANG Ze, LI Hao, LIU Dan, GU Dong-bo, MIAO Xiang-yue. Development and Application Analysis of a Tester for X-ray Detectors[J]. CT Theory and Applications, 2012, 21(4): 699-704.

Development and Application Analysis of a Tester for X-ray Detectors

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  • Received Date: June 11, 2012
  • Available Online: December 12, 2022
  • The X-ray detector tester is an essential testing device for testing the performance indexes of the linear array X-ray detector, the core component of X-ray security inspection equipment, such as signal gain, background noise signal, and signal crosstalk of adjacent pixels. Its function and key techniques are briefly discussed in this article. And a manual fine tuning tester for X-ray detectors design and manufactured by us is mostly introduced in this article. Moreover, its partial test results to some X-ray detectors are given and analyzed.
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